Takai, Mikio

Mikio Takai received BE, ME, and DE (phD) in 1971, 1973, and 1976 from Faculty of Engineering Science, Osaka University, Toyonaka, Osaka, Japan. He was awarded by Alexander von Humboldt Foundation and joined Fraunhofer Institute for Solid State Technology, in Munich, Germany until 1980. Since 1971 he worked on ion implantation in semiconductors and ion beam analysis. In particular, soft error reliability (single event upset) of SOI DRAMs was studied intensively using a nuclear microprobe with industry projects at Research Center for Quantum Science and Technology in Osaka University. He was invited by Uni-Erlangen, Germany, as a visiting professor in 1987 – 1988. Since 1993 he started to study field electron emission from various materials and structures.

He organized IVMC 2003 in Osaka and acted as a chairman of International Steering Committee (ISC) members in 2005 – 2010.

Prof. Emeritus Mikio Takai is a life Fellow member of the Japan Society of Applied Physics.